Nov. 23. 2017 | English | 繁中
 
 首页> 产品介绍> 整合元件暨材料  
积层陶瓷电容
电感
变压器与直插式电感
浆料
销售窗口
积层陶瓷电容 (MLCC)
MLCC电气规格
General Purpose & Mid-High Voltage & Low ESL Type
  Item Specification Test Method
Temp. compensating type High dielectric constant type
1 Operating Temperature Range Np0: -55 to 125 degree C

X7R: -55 to 125 degree C
X5R: -55 to 85 degree C
Y5V: -30 to 85 degree C

 
2 Rated Voltage 4VDC, 6.3VDC, 10VDC, 16VDC, 25VDC, 35VDC, 50VDC, 100VDC, 200VDC, 250VDC, 500VDC, 630VDC, 1000VDC, 2000VDC, 3000VDC The rated voltage is defined as the maximum voltage, which may be applied continuously to the capacitor.
3 Appearance No defects or abnormalities. Visual inspection
4 Dimensions Within the specified dimension. Using calipers
5 Dielectric Strength No defects or abnormalities. No failure shall be observed when 250%* of the rated voltage ( 150% for 500V, 120% for above 1KV ) is applied between the terminations for 1 to 5 seconds. The charge and discharge current is less than 50mA.
6 Insulation Resistance(I.R.)
Rated Voltage: <500V To apply rated voltage.

I.R. ≧10G or RiCR≧500Ω-F
(whichever is smaller)

Rated Voltage: ≧500V To apply 500V.
The insulation resistance shall be measured with a DC voltage not exceeding the rated voltage at 25℃ and 75%RH max, and within 1 minute of charging.
7 Capacitance

Within the specified tolerance
* X7R, X5R and Y5V at 1000 hours

The capacitance / D.F. shall be measured at 25°C at the frequency and voltage shown in the tables.

Item Class I
C≦1,000pF
Class II
>1,000pF
* Class II
Frequency 1.0±0.2MHz 1.0±0.2KHz 1.0±0.2KHz
Voltage 1.0±0.2Vrms 1.0±0.2Vrms 1.0±0.2Vrms

* For capacitance>10uF, the measure frequency is 120Hz+/-10% and voltage 0.5+/-1Vrms.

8 Q/Dissipation Factor(D.F.)

NP0:
If C≦30pF, DF≦1/(400+20C), C in pF
If C >30pF, DF≦0.1%.

I. X5R, X7R:
See X5R,X7R DF table
II. Y5V:
See Y5V DF table.

9 Capacitance Temperature Characteristics

Capacitance change
NPO within 0±30ppm/℃ under operating temperature range.

Capacitance change
X7R/X5R within ±15%
Y5V: -82 to + 22%

1. Temperature compensating type:
The capacitance value at 25℃ and 85℃ shall be measured and calculated from the formula given below.
T.C.=(C85-C25)/C25*△T*106(PPM/℃)

2.High dielectric constant type:
The ranges of capacitance change compared with the 25℃ value over the temperature ranges shall be within the specified ranges.

10 Termination Strength No removal of the terminations or marking defect. Apply a parallel force of 5N to a PCB mounted sample for 10±1sec. *2N for 0603 (EIA 0201).
11 Deflection(Bending Strength)

No cracking or marking defects shall occur at 1mm deflection.
Capacitance change:
NPO: within ±5% or ± 0.5pF. (whichever is larger)
X7R, X5R:within ±12.5%
Y5V: within ±20%

Solder the capacitor to the test jig(glass epoxy boards) shown in Fig.a using a eutectic solder(then let sit for 48±4 hours for X7R X5R and Y5V).
Then apply a force in the direction shown in Fig.b. The soldering shall be done with the reflow method and shall uniform and free of defects such as heat shock.
Size a b c
0603 0.3 0.9 0.3
1005 0.4 1.5 0.5
1608 1.0 3.0 1.2
2012 1.2 4.0 1.65
3216 2.2 5.0 2.0
4520 3.5 7.0 2.5
4532 3.5 7.0 3.7
12 Solderability of Termination

90% of the terminations are to be soldered evenly and continuously.

Immerse the test capacitor into a methanol solution containing rosin for 3 to 5 seconds, preheat it 150 to 180℃ for 2 to 3 minutes and immerse it into Sn-3.0Ag-0.5Cu solder of 245 ± 5℃ for 3±1seconds.
13 Resistance to Soldering Heat Appearance No marking defects

*Preheat the capacitor at 120 to 150℃ for 1 minute.
Immerse the capacitor in a SAC305(Sn96.5Ag3.0Cu0.5) ?solder solution at 270±5℃ for 10±1 seconds. Let sit at room temperature for 24±2 hours (temperature compensating type) or 48±4 hours (high dielectric constant type), then measure.

*Preheat at 150 to 200℃ for size ≧ 3216.

*High dielectric constant type: Initial measurement: perform a heat treatment at 150+/-10℃ for one hour and then let sit for 48±4hours at room temperature. Perform the initial measurement.
Cap. Change NP0 within ±2.5% or 0.25pF ( whichever is larger )

X7R/X5R within ±7.5%
Y5V within ±20%

Q/D.F.

If C≦30pF, DF≦1/(400+20C)
If C >30pF, DF≦0.1%

To satisfy the specified initial spec.
I.R.

I.R.≧10,000MW or RiCR≧500W-F.
(whichever is smaller)

I.R.≧10,000MW or RiCR≧500W-F.
(whichever is smaller)

14 Temperature cycle(Thermal shock) Appearance No marking defects

Solder the capacitor to supporting jig (glass epoxy board) and perform the five cycles according to the four heat treatments listed in the following table. Let sit for 24±2hrs at room temperature, then measure.

Step 1: Minimum operating temperature
30±3min
Step 2: Room temperature 2~3min
Step 3: Maximum operating temperature 30±3min
Step 4: Room temperature 2~3min

*High dielectric constant type: Initial measurement: perform a heat treatment at 150+/-10℃ for an hour and then let sit for 48±4 hours at room temp. Perform the initial measurement.

Cap. Change NP0 within ±2.5% or 0.25pF ( whichever is larger )

X7R/X5R within ±7.5%
Y5V within ±20%

Q/D.F.

If C≦30pF, DF≦1/(400+20C)
If C >30pF, DF≦0.1%

To satisfy the specified initial spec.
I.R.

I.R.≧10,000MW or RiCR≧500W-F.
(whichever is smaller)

I.R.≧10,000MW or RiCR≧500W-F.
(whichever is smaller)

15 Humidity load Appearance No marking defects

Apply the rated voltage at 40±2℃ and 90 to 95% humidity for 500±12 hours. Remove and let sit for 24±2 hours (temperature compensating type) or 48±4 hours (high dielectric constant type) at room temperature, then measure.
The charge / discharge current is less than 50mA.
Pre-treatment: Apply the rated DC voltage for 1 hr at 40±2℃ and 90 to 95% humidity. Remove and let sit for 48±4 hours, then perform the initial measurement.

Initial measurement for high dielectric type. Apply the rated DC voltage for 1 hour at 40±2℃. Remove and let sit for 48±4 hours at room temperature then perform initial measurement.
Cap. Change NP0 within ±7.5% or 0.75pF
( whichever is larger )

X7R/X5R within ±12.5%
Y5V within ±30%

Q/D.F.

If>30pF, DF≦0.5%
If C≦30pF,D≦1/(100+10xC/3) C in pF

X7R 200% max of initial spec.
Y5V 150% max of initial spec.
X5R 200% max of initial spec.

I.R.

I.R.≧500MW or RiCR≧25W-F.
(whichever is smaller)

I.R.≧500MW or RiCR≧25W-F.
(whichever is smaller)

16 High temperature load life test Appearance No marking defects

Apply 200%(150% for≧500V; 120% for≧1000V) of the rated voltage for 1000±12 hours at the maximum operating temperature ± 3℃. Let sit for 24± 2 hours (temperature compensating type) or 48±4 hours (high dielectric constant type) at room temperature, then measure.
The charge/discharge current is less than 50mA.
P.S.: Please refer to table 1 for items applying 150% voltage.
Pre-treatment:
Apply 200%* of the rated voltage for 1 hr at maximum operating temperature ±3℃. Remove and let sit for 48±4 hours, then perform the initial measurement.
* 150% for high dielectric constant type≧500V.
* 120% for voltage ≧ 1000V.
* some of the parts are applicable in rated voltage *1.5. please refer to table 1

Cap. Change NP0 within±7.5% or 0.75pF
(whichever is large)
X7R/X5R within±12.5%
Y5V within±30%
Q/D.F. If C>30pF,DF≦0.3%
If 10pF<C≦30pF,DF≦1/(275+5xC/2)
If C≦10pF, DF≦1/(200+10C), C in pF
X7R 200% max of initial spec.
Y5V 150% max of initial spec.
X5R 200% max of initial spec.
I.R. More than 1GΩ or RiCR≧50Ω-F
(whichever is less.)
More than 1GΩ or RiCR≧50Ω-F
(whichever is less.)
 
Table 1
T.C Product Range
X5R

0603 (EIA 0201): C > 10 nF
1005 (EIA 0402): C > 0.1 uF
1608 (EIA 0603): C ≧ 1.0 uF
2012 (EIA 0805): C ≧ 2.2 uF
3216 (EIA 1206): C ≧ 10 uF
3225 (EIA 1210): C ≧ 22 uF

Y5V

1005 (EIA 0402): C > 0.47 uF
1608 (EIA 0603): C > 1.0 uF
2012 (EIA 0805): C > 4.7 uF
3216 (EIA 1206): C > 10 uF
3225 (EIA 1210): C > 22 uF

 
X5R / X7R DF (tan δ) Table

Rated Voltage

Size

Capacitance

D.F Max.

X5R

X7R

4V

All

 

All

 

15.0%

 

6.3V

All

 

cap

≦1.0uF

10.0%

7.5%

All

1.0uF<

cap

<4.7uF

10.0%

10.0%

All

4.7uF≦

cap

≦100uF

15.0%

15.0%

10V

0603/3216/3225

 

All

 

7.5%

5.0%

0603

100nF≦

cap

 

10.0%

 

1005

 

cap

≦100nF

7.5%

5.0%

100nF<

cap

<330nF

7.5%

 

330nF≦

cap

 

10.0%

 

1608

 

cap

≦1.0uF

7.5%

5.0%

1.0uF<

cap

<2.2uF

7.5%

 

2.2uF≦

cap

 

10.0%

 

2012

 

cap

≦2.2uF

7.5%

5.0%

2.2uF<

cap

<6.8uF

7.5%

 

6.8uF≦

cap

 

10.0%

 

3225

10uF<

cap

≦22uF

10.0%

10.0%

16V

0603/3216/3225

 

All

 

5.0%

5.0%

1005

 

cap

≦100nF

5.0%

5.0%

100nF<

cap

≦220nF

7.5%

 

1608

 

cap

≦470nF

5.0%

5.0%

470nF<

cap

<1.0uF

7.5%

5.0%

1.0uF≦

cap

 

10.0%

5.0%

2012

 

cap

≦2.2uF

5.0%

5.0%

2.2uF<

cap

≦4.7uF

7.5%

 

4.7uF<

cap

≦10uF

10.0%

 

3216

4.7uF<

cap

 

10.0%

7.5%

3225

10uF

cap

≦22uF

15.0%

 

25V

All

 

All

 

5.0%

3.5%

1.0uF≦

cap

 

10.0%

 

1608

 

470nF

 

 

10.0%

3216

1.0uF<

cap

≦4.7u

5.0%

5.0%

4.7uF<

cap

 

10.0%

 

3225

4.7uF<

cap

≦10u

10.0%

 

≧50V

All

All but below

2.5%

3.0%

3216/3225

 

cap

≦1.0uF

3.5%

3.5%

 
Y5V DF (tan δ) Table

T.C

Rated? Voltage

Size

Capacitance

D.F Max

Y5V

4V

0603

 

ALL

 

16.0%

1005

 

ALL

 

20.0%

6.3V

0603

 

ALL

 

16.0%

1005

 

cap

≦220nF

12.5%

220nF<

cap

 

16.0%

1608/3225

 

ALL

 

12.5%

2012/3216

 

ALL

 

16.0%

10V

1005/1608/3225

 

ALL

 

12.5%

1005

220nF<

cap

 

16.0%

2012

 

cap

<10uF

12.5%

 

10uF

 

30.0%

3216

 

cap

≦4.7uF

12.5%

4.7uF<

cap

<22uF

16.0%

22uF≦

cap

 

30.0%

16V

1005

 

ALL

 

9.0%

1005

220nF<

cap

 

12.5%

1608

 

cap

≦100nF

7.0%

100nF<

cap

≦220nF

9.0%

220nF<

cap

 

12.5%

2012

 

cap

<4.7uF

9.0%

4.7uF≦

cap

 

12.5%

3216/3225

 

cap

≦2.2uF

9.0%

2.2uF<

cap

 

12.5%

3225

4.7F≦

cap

≦22uF

12.5%

25V/50V

1005

 

cap

<100nF

9.0%

1608

 

cap

<100nF

5.0%

 

100nF

 

7.0%

100nF<

cap

 

9.0%

2012

 

cap

<330nF

5.0%

 

330nF

 

7.0%

330nF<

cap

 

9.0%

3216/3225

 

cap

<1uF

5.0%

 

1uF

 

7.0%

1uF<

cap

 

9.0%

 
NP0 High Frequency Type (Q and Series)
  Item Specification Test Method
1 Operating Temperature Range Np0: -55 to 125 degree C  
2 Rated Voltage 16VDC, 25VDC and 50VDC The rated voltage is defined as the maximum voltage, which may be applied continuously to the capacitor.
3 Appearance No defects or abnormalities. Visual inspection
4 Dimensions Within the specified dimension. Using calipers
5 Dielectric Strength(Flash) No defects or abnormalities. No failure shall be observed when 250% * of the rated voltage is applied between the terminations for 1 to 5 seconds. The charge and discharge current is less than 50mA.
6 Insulation Resistance(I.R.) I.R.≧10GΩ The insulation resistance shall be measured with a DC voltage not exceeding the rated voltage at 25°C and 75% RH max, and within 1 minute of charging.
7 Capacitance Within the specified tolerance

The capacitance / D.F. shall be measured at 25°C at the frequency and voltage shown in the tables.

Frequency 1.0±0.2MHz
Voltage 1.0±0.2Vrms

8 Quality Factor(Q) 1,000 min.
9 Capacitance Temperature Characteristics Capacitance change within 0±30ppm/℃ under operating temperature range. The capacitance value at 25℃ and 85℃ shall be measured and calculated from the formula given below.
T.C.=(C85-C25)/C25*△T*106(PPM/℃)
10 Termination Strength No removal of the terminations or marking defect. Apply a parallel force of 5N to a PCB mounted sample for 10±1sec. * 2N for 0603(EIA 0201)
11 Deflection(Bending Strength) Appearance: No cracking or marking defects shall occur at 1mm deflection.
Capacitance chang: within±2.5% or ±0.25pF.(whichever is large)

Solder the capacitor to the test jig (glass epoxy boards) shown in Fig.a. Using a SAC305(Sn96.5Ag3.0Cu0.5) solder.
Then apply a force in the direction shown in Fig.b.
The soldering shall be done with the reflow method and shall uniform and free of defects such as heat shock.

Size a b c
0603 0.3 0.9 0.3
1005 0.4 1.5 0.5
1608 1.0 3.0 1.2
2012 1.2 4.0 1.65
12 Solderability of Termination 90% of the terminations are to be soldered evenly and continuously. Immerse the test capacitor into a methanol solution containing rosin for 3 to 5 seconds, preheat it 150 to 180℃ for 2 to 3 minutes and immerse it into Sn-3.0Ag-0.5Cu solder of 245 ± 5℃ for 3±1seconds.
13 Resistance to Soldering Heat Appearance No marking defects Preheat the capacitor at 120 to 150℃ for 1 minute.
Immerse the capacitor in a eutectic solder solution at 270±5℃ for 10±1 seconds. Let sit at room temperature for 24±2 hours, then measure.
Cap. Change NP0 within±2.5% or 0.25pF
(whichever is large)
Q Initial spec.
I.R. Initial spec.
14 Temperature cycle(Thermal shock) Appearance No marking defects

Solder the capacitor to supporting jig(glass epoxy board) and perform the five cycles according to the four heat treatments listed in the following table. Let sit for 24±2hrs at room temperature, then measure.

Step 1:Minimum operating temperature
30±3min
Step 2:Room temperature 2~3min
Step 3:Maximum operating temperature 30±3min
Step 4:Room temperature 2~3min
Cap. Change NP0 within±2.5% or 0.25pF
(whichever is large)
Q/D.F. Initial spec.
I.R. Initial spec.
15 Humidity load Appearance No marking defects Apply the rated voltage at 40±2℃ and 90 95% humidity for 500±12 hours. Remove and let sit for 24±2 hours at room temperature, then measure.
The charge / discharge current is less than 50mA.
Cap. Change NP0 within±5% or 0.5pF
(whichever is large)
Q 200 min.
I.R. I.R.≧500MΩ
16 High temperature load life test Appearance No marking defects Apply 200% of the rated voltage for 1000±12 hours at the maximum operating temperature ±3℃. Let sit for 24±2 hours at room temperature, then measure.
The charge / discharge current is less than 50mA.
Cap. Change NP0 within±5% or 0.5pF
(whichever is large)
Q 350 min.
I.R. I.R.≧1GΩ
   
联络我们 / 厂商专区 / 同仁专区 / 网站地图
Copyright© 2015 Darfon Electronics Corp. All rights reserved.